Friday, December 08, 2006
CICC2006
アメリカカリフォルニア州サンノゼで開催されたCICC2006(The 2006 IEEE Custom Integrated Circuits Conference )でD2の小笠原泰弘君が2件の発表を行いました(2006/9/13)。
``Measurement of Inductive Coupling Effect on Timing in 90nm Global Interconnects''
``Measurement results of delay degradation due to power supply noise well correlated with full-chip simulation''