"Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs"
また共同研究を行っている渡辺先生が共同研究成果を発表しました(2017/10/5)
"Momentum and Supply Voltage Dependencies of SEUs Induced by Low-energy Negative and Positive Muons in 65-nm UTBB-SOI SRAMs"
