"Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM"
"Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag"
"Soft Error Immune Latch Design for 20 nm bulk CMOS"
Thursday, April 23, 2015
IRPS 2015
カリフォルニア州モントレーで開催されたIEEE International Reliability Physics Symposium (IRPS)において、社会人Dを卒業した上村さんの成果を橋本が代理でポスター発表しました(2015/4/22)。
"Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM"
"Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag"
"Soft Error Immune Latch Design for 20 nm bulk CMOS"
"Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM"
"Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag"
"Soft Error Immune Latch Design for 20 nm bulk CMOS"
