``Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-biased Circuits and Subthreshold Circuits''
Friday, November 14, 2008
Workshop on Test Structure Design for Variability Characterization
カリフォルニア州サンノゼで開催されたICCAD併設のWorkshop on Test Structure Design for Variability CharacterizationでD1の更田裕司君が研究成果を発表をしました(2008/11/13)。
``Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-biased Circuits and Subthreshold Circuits''
``Vth Variation Modeling and Its Validation with Ring Oscillation Frequencies for Body-biased Circuits and Subthreshold Circuits''
